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تعداد ۱۷ پاسخ غیر تکراری از ۲۰ پاسخ تکراری در مدت زمان ۰,۶۱ ثانیه یافت شد.

1. An introduction to logic circuit testing /

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Author: Parag K. Lala

Library: Center and Library of Islamic Studies in European Languages (Qom)

Subject: Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing

Classification :

2. An introduction to logic circuit testing

  • اطلاعات استناد دهی
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Author: Lala, Parag K.,

Library: Central Library and Document Center of Isfahan University (Esfahan)

Subject: Logic circuits - Testing ► Digital electronics - Testing ► Integrated circuits - Very large scale integration- Testing

Classification :
621
L193i

3. An introduction to logic circuit testing

  • اطلاعات استناد دهی
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Author: Lala, Parag K.,

Library: Central Library and Document Center of Isfahan University (Esfahan)

Subject: Logic circuits - Testing ► Digital electronics - Testing ► Integrated circuits - Very large scale integration- Testing

Classification :
621
L193i

4. An introduction to logic circuit testing

  • اطلاعات استناد دهی
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Author: Lala, Parag K.,

Library: Central Library and Document Center of Isfahan University (Esfahan)

Subject: Logic circuits - Testing ► Digital electronics - Testing ► Integrated circuits - Very large scale integration- Testing

Classification :
621
L193i

5. Digital Circuit Testing and testability

  • اطلاعات استناد دهی
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Author: Lala, Parag K

Library: Central Library and Document Center of Isfahan University (Esfahan)

Subject: Integrated circuits- Very large scale integration- Testing ► Digital integrated circuits- Testing ► Integrated circuits- Fault tolerance

Classification :
621
0287

6. Digital circuit testing and testability

  • اطلاعات استناد دهی
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Author: Lala, Parag K.

Library: Central Library and Documentation Center (Kerman)

Subject: Testing ، Integrated circuits - Very large scale integration,Testing ، Digital integrated circuits,، Integrated circuits - Fault tolerance

Classification :
TK
7874
.
75
.
L35
1997

7. Digital circuit testing and testability

  • اطلاعات استناد دهی
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Author: Lala, Parag K.

Library: Central Library of Sharif University of Technology (Tehran)

Subject: ، Integrated circuits-- Very large scale integration-- Testing,، Digital integrated circuits-- Testing,، Integrated circuits-- Fault tolerance

Classification :
TK
7874
.
75
.
L35
1997

8. Fault tolerant and fault testable hardware design

پدیدآورنده : Parag K. Lala

موضوع : Electronic digital computers- Reliability,Fault-tolerant computing

۴ نسخه از این کتاب در ۳ کتابخانه موجود است.

9. Fault tolerant and fault testable hardware design

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Author: Lala, Parag K.

Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)

Subject: Reliability ، Electronic digital computers,، Fault-Tolerant computing

Classification :
TK
7888
.
3
.
L27
1985

10. Fault tolerant and fault testable hardware design

  • اطلاعات استناد دهی
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Author: Lala, Parag K., 1948-

Library: Central Library of Esfehan University of Technology (Esfahan)

Subject: Electronic digital computers- Reliability►Fault-tolerant computing

Classification :
7888
.
3
.
L27
1985

11. Fault tolerant & fault testable hardware design

  • اطلاعات استناد دهی
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Author: LALA,PARAG K

Library: Central Library of Amirkabir University of Technology (Tehran)

Subject: ELECTRONIC DIGITAL COMPUTERS-RELIABILITY , FAULT-TOLERNT COMPUTING

Classification :
TK
7888
.
3
.
L27

12. Principles of modern digital design

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Author: Lala, Parag K.

Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)

Subject: ، Logic design,Design and construction ، Logic circuits,، Digital electronics

Classification :
TK
7868
.
L6
L3486
2007

13. Principles of modern digital design

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Author: / Parag K. Lala

Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

Subject: Logic design,Logic circuit--Design and construction,Digital electronics

Classification :
E-BOOK

14. Principles of modern digital design

  • اطلاعات استناد دهی
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Author: / Parag K. Lala

Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)

Subject: Logic design,Logic circuits- Design and construction,Digital electronics

Classification :
TK7868
.
L6L3486
2007

15. Self-checking and fault-tolerant digital design

  • اطلاعات استناد دهی
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Author: Lala, Parag K

Library: Central Library of Sharif University of Technology (Tehran)

Subject: Design and construction ، Electronic digital computers,، Fault-tolerant computing,، Logic design,، Sequential machine theory

Classification :
TK
7888
.
3
.
L274
2001

16. Self-checking and fault-tolerant digital design

  • اطلاعات استناد دهی
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Author: Parag K. Lala

Library: Library of Institute for Research in Fundamental Sciences (Tehran)

Subject: Design and construction ، Electronic digital computers,، Fault-tolerant computing,، Logic design,، Sequential machine theory

Classification :
TK
7888
.
3
.
L2

17. Self-checking and fault-tolerant digital design

  • اطلاعات استناد دهی
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Author: Lala, Parag K., 1948-

Library: Central Library of Esfehan University of Technology (Esfahan)

Subject: Electronic digital computers ► Fault-tolerant computing ► Logic design ► Sequential machine theory

Classification :
7888
.
3
.
L274
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